20090013218 | DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING - Methods, systems and modules for datalog management. In one embodiment, the logging of data is allowed to at least occasionally occur while the handling equipment is preparing device(s) for testing. Additionally or alternatively, in one embodiment with a plurality of test site controllers, after testing has been completed at all test site(s) associated with a particular test site controller the logging of data relating to that test site controller is allowed to at least occasionally occur while testing is continuing at test site(s) associated with other test site controller(s). | 01-08-2009 |