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OMETRIC CORPORATION

OMETRIC CORPORATION Patent applications
Patent application numberTitlePublished
20090002697Optical Analysis Systems and Methods for Dynamic, High-Speed Detection and Real-Time Multivariate Optical Computing - Multivariate optical analysis systems employ multivariate optical elements and utilize multivariate optical computing methods to determine information about a product carried by light reflected from or transmitted through the product. One method of processing and monitoring the product includes introducing the product at an inspection point; illuminating the product with a spectral-specific light though an optic lens; directing the light that has passed through at least a section of the product through at least one multivariate optical element to produce a first signal, the directed light carrying information about the product; detecting the first signal at a first detector; deflecting a portion of the directed light to produce a second signal in a direction of a second detector, the second detector configured to detect the second signal; and determining at least one property of the product at a rate of about one section of the product per second to about five sections of the product per second based upon the detector outputs.01-01-2009