| NOKOMIS, INC Patent applications |
| Patent application number | Title | Published |
|---|
| 20110320170 | METHOD AND APPARATUS FOR THE DIAGNOSIS AND PROGNOSIS OF ACTIVE IMPLANTS IN OR ATTACHED TO BIOLOGICAL HOSTS OR SYSTEMS - A method and apparatus to measure and analyze electromagnetic emissions from implanted electronics to accomplish at least one of: detect and identify an active implant comprising electronics implanted in a biological host, diagnose the health of individual electronics as well as their health as an ensemble, and predict probable degradation of individual electronics, degradation of the electronic ensemble, and of the active implant in an automated fashion. The methods comprise filtering techniques to extract the information about the active implant's electronics by filtering out relevant biological effects induced by the active implant's biological situation. Said detection, identification, diagnosis, and prognosis are based on the measurement of intentional and unintentional electromagnetic emissions that emanate from the implant electronics of the active implant in a given biological situation. | 12-29-2011 |
| 20110095934 | IDENTIFICATION AND ANALYSIS OF SOURCE EMISSIONS THROUGH HARMONIC PHASE COMPARISON - The present invention is a signal processing method to significantly improve the detection and identification of source emissions. More particularly, the present invention offers a processing method to reduce the false alarm rate of systems which remotely detect and identify the presence of electronic devices through an analysis of a received spectrum the devices' unintended emissions. The invention identifies candidate emission elements and determines their validity based on a frequency and phase association with other emissions present in the received spectrum. The invention compares the measured phase and frequency data of the emissions with a software solution of the theoretically or empirically derived closed-form expression which governs the phase and frequency distribution of the emissions within the source. Verification of this relationship serves to dramatically increase the confidence of the detection. | 04-28-2011 |
| 20100123453 | ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL - The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component. | 05-20-2010 |
