| NICTECH CO., LTD. Patent applications |
| Patent application number | Title | Published |
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| 20080309363 | PROBE ASSEMBLY WITH WIRE PROBES - Disclosed is a probe assembly for use in electrical testing of a testing object and a method of the probe assembly. The probe assembly has a probe supporter body having a first side surface and a first facing surface and a plurality of wire probes. One of the plurality of wire probes has a first arm generally extending in a first direction, a second arm electrically and physically connected to the first arm and generally extending in a second direction other than the first direction, a first terminal portion formed at a distal end of the first arm and comprising a first tip, and a second terminal portion formed at a distal end of the second arm and comprising a second tip. The assembly further has a securing film placed over a portion of the second arm and keeping the portion of the second arm from moving. | 12-18-2008 |
| 20080309362 | PROBE ASSEMBLY WITH PROBES FOR ELECTRICAL TESTING - Disclosed is a probe assembly for use in electrical testing of an object, a probe, and a method of making the probe assembly. The probe assembly has a probe supporter body elongated in a first direction and comprising a first side surface, a second side surface, a first facing surface and a second facing surface, wherein the first and second facing surfaces are configured to face a testing object, wherein the first and second facing surfaces are substantially nonparallel to each other. The assembly further has a plurality of first slots formed on the first side surface and the first facing surface and a plurality of second slots formed on the second side surface and the second facing surface. Each slot is configured to receive a portion of a probe. | 12-18-2008 |
