Neaspec GmbH Patent applications |
Patent application number | Title | Published |
20150089694 | METHOD FOR MEASURING THE NEAR-FIELD SIGNAL - The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method. | 03-26-2015 |
20130145505 | NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM - The invention relates to a device for conducting near-field optical measurements of a specimen comprising an optical imaging system, the use of such device and to a method for adjusting the probe or the illumination of the probe in such a device. | 06-06-2013 |