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Nanonis GMBH

Nanonis GMBH Patent applications
Patent application numberTitlePublished
20090307809SCANNING PROBE MICROSCOPE AND METHOD FOR OPERATING THE SAME - The scanning probe microscope has a primary control loop (12-10-2009
20080266153HIGH RESOLUTION DIGITAL ANALOG CONVERSION CIRCUIT - To increase the accuracy and resolution of an m bit digital analog converter, n bit input values with n>m are fed to a control circuit and converted to a series of control values for the digital analog converter using dithering techniques. When the series of control values straddles a major transition where a large number of bits are switched between 1 and 0, a corrected series of control values is retrieved from a calibration table. The corrected series takes into account the glitch effects observed at the output of digital analog converter at a major transition.10-30-2008