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NanoMegas SPRL
| NanoMegas SPRL Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20110220796 | METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION - A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location ( | 09-15-2011 |