Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Nanolnk, Inc.
Skokie, IL US
| Nanolnk, Inc. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100071098 | SCANNING PROBE EPITAXY - A dual tip probe for scanning probe epitaxy is disclosed. The dual tip probe includes first and second tips disposed on a cantilever arm. The first and second tips can be a reader tip and a synthesis tip, respectively. The dual tip probe further includes a rib disposed on the cantilever arm between the first and second tips. The dual tip probe can also include a strain gauge disposed along the length of the cantilever arm. | 03-18-2010 |