NANOFACTORY INSTRUMENTS AB Patent applications |
Patent application number | Title | Published |
20120138792 | OPTICAL PROBING IN ELECTRON MICROSCOPES - The present invention relates to an optical arrangement and in particular to an optical arrangement for use in electron microscopy applications. This is used for sample characterization with simultaneous measurement with the electron microscopy of the sample and measurements with an optical setup and/or using a manipulator for probing of a light source or a scanning probe device. | 06-07-2012 |
20110016592 | ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE - A method, system, device, and software for automatically determining PI feedback parameters in a scanning probe microscopy application setup using an iterative feedback tuning process. | 01-20-2011 |
20100230608 | SAFE MOTION - The present invention relates to an inertial slider ( | 09-16-2010 |
20080276727 | Mems Nanoindenter - In recent years there has been a growing market for more universal analysis instruments. Analysis tools such as AFM | 11-13-2008 |