| NANOFACTORY INSTRUMENTS AB Patent applications |
| Patent application number | Title | Published |
|---|
| 20110016592 | ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE - A method, system, device, and software for automatically determining PI feedback parameters in a scanning probe microscopy application setup using an iterative feedback tuning process. | 01-20-2011 |
| 20100230608 | SAFE MOTION - The present invention relates to an inertial slider ( | 09-16-2010 |
| 20080276727 | Mems Nanoindenter - In recent years there has been a growing market for more universal analysis instruments. Analysis tools such as AFM | 11-13-2008 |
