NANO CMS CO., LTD.
|NANO CMS CO., LTD. Patent applications|
|Patent application number||Title||Published|
|20150183938||-POLYOXO CROSSLINKED PHTHALOCYANINE COMPOUND, PREPARING METHOD THEREOF, AND NEAR INFRARED RAY ABSORBING AND REFLECTING COMPOSITION USING THE SAME - Disclosed herein are a μ-polyoxo crosslinked phthalocyanine compound, a preparing method thereof; and a near infrared ray absorbing and reflecting composition using the same, and more particularly, a μ-polyoxo crosslinked phthalocyanine compound having high absorption at a wavelength of 800 to 950 nm and high reflectance at a wavelength of 1200 nm or more, a preparing method of a μ-polyoxy crosslinked phthalocyanine compound simultaneously having near infrared ray absorption and reflection properties as described above, and a near infrared ray absorbing and reflecting composition using the μ-polyoxo crosslinked phthalocyanine compound. According to the exemplary embodiment of the present invention, there is provided a μ-polyoxo crosslinked molybdenum phthalocyanine compound capable of absorbing and reflecting near infrared ray at the same time.||07-02-2015|
|20140119513||METHOD AND APPARATUS FOR MEASURING THIN FILM THICKNESS USING X-RAY - Provided is an apparatus and method for measuring for measuring a thickness of thin film using x-ray where a thickness of a thin film of nanometer(nm)-level can be accurately measured without destructing an target sample, through determination of thickness of thin film of the target sample, by determining a calibration curve by comparing a difference of intensities of signals scattered by a special component included in a base layer of the reference sample having a base layer and a base layer formed with the thin film layer with a thickness of the thin film layer, and determining the thickness of thin film layer of the target sample by comparing a difference of intensities of signals scattered by the special component included in the base layer of the target sample having the base layer formed with the thin film layer with the reference sample having the base layer with the calibration curve.||05-01-2014|
|20120085280||SILVER THIN-FILM SPEAD APPARATUS BY MEANS OF DEPOSITION OF NANO METALLIC SILVER - Disclosed is a silver thin film spread apparatus by means of deposition of nano metallic silver, the apparatus comprising: a treatment booth formed at one side with an inlet for inputting a substrate, and formed at the other side with an outlet for discharging the substrate; a transfer device formed at a lower side of the treatment booth for transferring the substrate; a spray device formed at an upper side of the treatment booth for spraying silver solution on a surface of the substrate; a moving device for linearly reciprocating the spray device; and a rotation device formed at the lower side of the treatment booth for rotating the substrate, whereby reflectivity can be enhanced by increasing film compactness and coating uniformity of thin film, where the substrate is rotated at a predetermined constant speed to allow the spray guns to linearly reciprocate and to allow the nano silver thin film to be uniformly spread and deposited on the surface of the substrate at a predetermined constant frequency.||04-12-2012|
|20100291309||METHOD FOR ELECTROLESS DEPOSITION OF NANO METALLIC SILVER AND REFLECTOR OF HIGH REFLECTANCE DEPOSITED BY NANO METALLIC SILVER USING THE SAME - The present invention relates to an electroless deposition of metallic silver on various plates. More particularly, in the present invention, by spraying a silver solution including ionic silver to be reduced into metallic silver and a reducing solution a reducing agent for reducing the silver solution at the same time to a predetermined region above a substrate, metallic silver particles having a diameter less than 30 Å are formed, and a silver layer is formed by a deposition of the nano-sized metallic silver.||11-18-2010|
Patent applications by NANO CMS CO., LTD.