| MULTITEST ELEKTRONISCHE SYSTEME GMBH Patent applications |
| Patent application number | Title | Published |
|---|
| 20100315113 | HANDLER FOR ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, COMPRISING CIRCULATING UNITS, THE TEMPERATURE OF WHICH CAN BE CONTROLLED - A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station. | 12-16-2010 |
| 20100311285 | CONTACT BASE - In a contact base with a plurality of contact springs for making contact with electronic components, in particular ICs, the contact springs each have an elongate contact blade, the longitudinal centre plane of said contact blade being situated parallel to the bending plane of the spring arm of the contact spring. Furthermore, the spring arm is formed in such a way that, when a pin is pressed, the contact blade moves in a direction which differs from the feed direction of the component in such a way that the contact blade moves along the pin. | 12-09-2010 |
| 20100303589 | PLUNGER FOR HOLDING AND MOVING ELECTRONIC COMPONENTS IN PARTICULAR ICS - A plunger for holding and moving electrical components in particular IC's to and from a contacting device connected to a test bed, comprises a head piece with a fluid distribution chamber through which temperature-controlled fluid flows. A suction head is arranged such that the temperature-controlled fluid flows around the suction head and is diverted along the suction head to the component. | 12-02-2010 |
| 20100209864 | TEMPERING CHAMBER FOR TEMPERING ELECTRONIC COMPONENTS IN PARTICULAR IC'S - The invention relates to a tempering chamber for tempering electronic components, in particular, IC's, with a circulating device ( | 08-19-2010 |
| 20100206768 | DEVICE AND METHOD FOR ALIGNING AND HOLDING A PLURALITY OF SINGULATED SEMICONDUCTOR COMPONENTS IN RECEIVING POCKETS OF A TERMINAL CARRIER - In a device and a method for aligning and holding a plurality of singulated semi-conductor components in receiving pockets of a terminal carrier ( | 08-19-2010 |
| 20100196125 | PLUNGER FOR HOLDING AND MOVING ELECTRICAL COMPONENTS - A plunger for holding and moving electronic components in particular for introduction and removal of IC's to and from a contacting device connected to a test bed comprises a plunger head with at least one suction head for sectional contact with a component. A heat-conducting body, temperature-controlled by means of a fluid, is arranged such that the suction-contacted component is in contact with the heat-conducting body. The suction head passes through the heat-conducting body. | 08-05-2010 |
| 20100193520 | CLOSURE MECHANISM FOR PRESSURE TEST CHAMBERS FOR TESTING ELECTRONIC COMPONENTS, IN PARTICULAR IC'S - A closure mechanism for pressure test chambers for testing electronic components, in particular ICs, has a plurality of pivoting jaws. At least some of the pivoting jaws have at least one lifting apparatus which can be advanced to two interacting cavity elements, which surround a cavity, by means of the pivoting jaws. Furthermore, at least some of the pivoting jaws have at least one locking device in order to move spacer elements into an intermediate space between the associated pivoting jaws and the compressed cavity element, as a result of which the tightness of the cavity is maintained even when the lifting apparatuses are retracted. | 08-05-2010 |
| 20100164482 | CENTERING DEVICE FOR ELECTRONIC COMPONENTS, PARTICULARLY ICS - A centering device for electronic components, particularly for ICs, has at least one centering unit comprising two L-shaped centering elements and two coupling elements. The centering elements and coupling elements are hinged together such that a pivoting movement of the coupling elements is forcibly coupled to a parallel displacement of the centering elements, thus causing a widening or narrowing of a centering opening for the components. | 07-01-2010 |
| 20080231296 | Test Apparatus for the Testing of Electronic Components - In the case of a test apparatus for testing electronic components which are present in an assembly, in particular in the form of strips, a slide-like contacting board supporting device ( | 09-25-2008 |
