| MRA TEK, LLC Patent applications |
| Patent application number | Title | Published |
|---|
| 20120044594 | Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media - Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished. | 02-23-2012 |
| 20090213712 | Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media - Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished. | 08-27-2009 |
