MEIWA E-TEC CO., LTD.
TOYOTA-SHI, AICHI, JP
MEIWA E-TEC CO., LTD. Patent applications | ||
Patent application number | Title | Published |
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20130021601 | ABNORMAL MEASUREMENT DETECTION DEVICE AND METHOD FOR INFRARED RADIATION THERMOMETER - A technique for an infrared radiation thermometer used for theiniography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer. | 01-24-2013 |
20100098321 | TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD - Feature points ( | 04-22-2010 |