| 20100067770 | SYSTEM AND METHOD RELATING TO EXAMINATION OF AN OBJECT - The present invention relates to a system and method for non-invasively examination of internal structures of an object by producing dielectric images utilizing reflection and transmission 5 measurements using microwave radiation, characterized by an antenna array surrounding a region of interest for the examination, a microwave transceiver for measuring reflected and transmitted electromagnetic fields, a computational module for receiving detected radiation and for processing data based on the detected radiation, the computational module further being operatively arranged to execute a reconstruction procedure utilized to compute an image of the 10 dielectric profile under detection. | 03-18-2010 |
