MDS Analytical Technologies, a business unit of MDS, Inc.
|MDS Analytical Technologies, a business unit of MDS, Inc. Patent applications|
|Patent application number||Title||Published|
|20110183431||MASS ANALYSIS SYSTEM WITH LOW PRESSURE DIFFERENTIAL MOBILITY SPECTROMETER - A mass analysis system including a low pressure dissociation region and a differential mobility spectrometer. The differential mobility spectrometer including at least one pair of filter electrodes defining an ion flow path where the filter electrodes generate an electric field for passing through a selected portion of the sample ions based on the mobility characteristics of the sample ions. The differential mobility spectrometer also includes a voltage source that provides DC and RF voltages to at least one of the filter electrodes to generate the electric field, an ion inlet that receives sample ions that have passed through the low pressure dissociation region, and an ion outlet that outputs the selected portion of the sample ions. A mass spectrometer receives some or all of the selected portion of the sample ions.||07-28-2011|
|20100078551||Method, System And Apparatus For Multiplexing Ions In MSn Mass Spectrometry Analysis - A method and apparatus for multiplexing ions in an MSn mass spectrometer is provided. Ion are filtered to produce a group of ions of interest, the group of ions below a space charge limit of the MSn mass spectrometer. At least a portion of the group of ions are fragmented to form a fragmented group of ions. At least a portion of the fragmented group are stored such that a plurality of portions of the fragmented group can be sequentially selected for mass spectrometry analysis. Each of the plurality of portions of the fragmented group are sequentially selected and re-fragmented prior to mass spectrometry analysis. Each of the plurality of portions of the fragmented group are analyzed, via mass spectrometry, once each of the plurality of portions of the fragmented group has been fragmented.||04-01-2010|
|20090294650||Method And System For Vacuum Driven Differential Mobility Spectrometer/Mass Spectrometer Interface With Adjustable Resolution And Selectivity - A mass spectrometer system including a differential mobility spectrometer and a mass spectrometer at least partially sealed to, and in fluid communication, with, the differential mobility spectrometer, together with a related method, are provided. The mass spectrometer system can be operable to, and method can comprise, a) maintaining the differential mobility spectrometer at an internal operating pressure; b) providing ions to the differential mobility spectrometer; c) maintaining the mass spectrometer at a vacuum pressure lower than the internal operating pressure to draw a gas flow including the ions through the differential mobility spectrometer and into the vacuum chamber; and, d) modifying the gas flow between the differential mobility spectrometer and the mass spectrometer to change a gas flow rate through the differential mobility spectrometer.||12-03-2009|
|20090294648||METHOD AND SYSTEM FOR PROVIDING A MODIFIER TO A CURTAIN GAS FOR A DIFFERENTIAL MOBILITY SPECTROMETER - A system including a differential mobility spectrometer is described as is a method of operating the system including the differential mobility spectrometer. The method and system involve a) providing ions to the differential mobility spectrometer; b) providing a drift gas to an inlet of the differential mobility spectrometer; c) adjusting a meter to define a selected volumetric flow rate for supplying a modifier liquid to the drift gas; and, d) supplying an actual volumetric flow rate of the modifier liquid to the drift gas, wherein the actual volumetric flow rate is within a percentage deviation from the selected volumetric flow rate||12-03-2009|
|20090166534||METHOD AND APPARATUS FOR REDUCING SPACE CHARGE IN AN ION TRAP - Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.||07-02-2009|
|20090121126||HIGH RESOLUTION EXCITATION/ISOLATION OF IONS IN A LOW PRESSURE LINEAR ION TRAP - Methods for improved separation of ions from an ion trap employing a combination of low pressure and low amplitude ion excitation, including methods for removing, from an ion trap ion population, ions having a m/z value neighboring that of an ion of interest, mass spectrometry methods providing improved resolution of ion detection, and programmable apparatus programmed with instructions therefor.||05-14-2009|
|20090050796||METHOD FOR ENHANCING MASS ASSIGNMENT ACCURACY - A method of operating an ion trap spectrometer system having an ion trap is provided. The method comprises a) providing a group of ions for analysis, wherein the group of ions includes a first analyte; b) providing a filtered first analyte having a first mass-to-charge ratio by filtering out ions other than the first analyte; c) storing the filtered first analyte in the ion trap; d) storing a first set of calibrant ions in the ion trap with the filtered first analyte, wherein the first set of calibrant ions has at least one calibrant ion and each calibrant ion in the first set of calibrant ions has a known mass-to-charge ratio; e) transmitting the filtered first analyte and the first set of calibrant ions from the ion trap for detection; f) detecting the filtered first analyte to generate a first analyte mass signal peak representing the filtered first analyte, and detecting each calibrant ion in the first set of calibrant ions to generate an associated calibrant mass signal peak for each calibrant ion in the first set of calibrant ions; and, g) calibrating a first mass signal derived from the first analyte mass signal peak by comparing the known mass-to-charge ratio and the associated calibrant mass signal peak for each calibrant ion in the first set of calibrant ions.||02-26-2009|
|20080203286||APPARATUS AND METHOD FOR COOLING IONS - An apparatus for secondary ion mass spectrometry is provided having a target surface for supporting a sample on the target surface and an ion source configured to direct a beam of primary ions toward the sample to sputter secondary ions and neutral particles from the sample, A first chamber having an inlet provides gas to maintain high pressure at the sample for cooling the secondary ions and neutral particles, the high pressure being in the range of about 10||08-28-2008|
Patent applications by MDS Analytical Technologies, a business unit of MDS, Inc.