| 20110181704 | METHOD AND SYSTEM FOR PROVIDING THREE-DIMENSIONAL AND RANGE INTER-PLANAR ESTIMATION - A system, apparatus and method of performing 3-D object profile inter-planar estimation and/or range inter-planar estimation of objects within a scene, including: providing a predefined finite set of distinct types of features, resulting in feature types, each feature type being distinguishable according to a unique bi-dimensional formation; providing a coded light pattern having multiple appearances of the feature types; projecting the coded light pattern, having axially varying intensity, on objects within a scene, the scene having at least two planes, resulting in a first plane and a second plane; capturing a 2-D image of the objects having the projected coded light pattern projected thereupon, resulting in a captured 2-D image, the captured 2-D image including reflected feature types; determining intensity values of the 2-D captured image; and performing 3-D object profile inter-planar estimation and/or range inter-planar estimation of objects within the scene based on determined intensity values. | 07-28-2011 |
| 20100074532 | 3D GEOMETRIC MODELING AND 3D VIDEO CONTENT CREATION - A system, apparatus and method of obtaining data from a 2D image in order to determine the 3D shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising: (a) providing a predefined set of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation; (b) providing a coded light pattern comprising multiple appearances of said feature types; (c) projecting said coded light pattern on said objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features; (d) capturing a 2D image of said objects having said projected coded light pattern projected thereupon, said 2D image comprising reflected said feature types; and (e) extracting: (i) said reflected feature types according to the unique bi-dimensional formations; and (ii) locations of said reflected feature types on respective said epipolar lines in said 2D image. | 03-25-2010 |
