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LTX CORPORATION

LTX CORPORATION Patent applications
Patent application numberTitlePublished
20090015267System and Method for Distortion Analysis - A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.01-15-2009