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LogicVision, Inc.
| LogicVision, Inc. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100037109 | METHOD FOR AT-SPEED TESTING OF MEMORY INTERFACE USING SCAN - A method and a circuit of testing of a memory interface associated with an embedded memory in a semiconductor circuit involves writing to two memory locations in succession; reading the two memory locations in succession in the same order in which the two memory locations were written; capturing output data from the memory interface; and analyzing captured output data to determine whether said captured output data corresponds to expected data. | 02-11-2010 |