LIGHTWAVES 2020, INC.
|LIGHTWAVES 2020, INC. Patent applications|
|Patent application number||Title||Published|
|20140204443||Tunable Optical Filter and Method of Manufacture Thereof - A tunable optical filter is formed in the structure of an etalon. A thin electro-optic ceramic substrate is fixed between two end substrates. Each end substrate has an inner parallel surface toward said electro-optic ceramic substrate covered by an electrode layer and a reflecting layer. An adhesive which attaches the electro-optic ceramic substrate to each first and second end substrates has a consistency so as to avoid stress on the electro-optic ceramic substrate. A voltage imposed on the electro-optic ceramic substrate by the electrode layers on the inner parallel surfaces of the first and second end substrates effectively controls an optical distance between the reflective coating layers on the inner parallel surfaces of the first and second end substrates of the etalon structure. The electro-optic ceramic substrate is preferably PMN-PT ((1-x)Pb(Mg⅓Nb⅔)O||07-24-2014|
|20100245974||Multi-Fiber Section Tunable Optical Filter - A tunable optical filter is formed by the longitudinal alignment of two opposing end sections of single-mode optical fibers. On at least one of the end sections is a collimator fiber section which is formed from a section of a graded-index, multimode optical fiber which is an odd number of quarter pitches long. The collimator fiber section has an angled end surface which joined to the reciprocally angled end surface of the at least one single-mode optical fiber end section. Piezoelectric material controls the separation between the first and second single-mode optical fiber end sections and sets the wavelengths of optical signals carried through the first and second single-mode optical fiber end sections.||09-30-2010|
|20090091759||Multiple Wavelength Optical Analyzer Device - A device and method of operation for analyzing signal features over multiple optical wavelengths is presented. A plurality of rotating thin film filters is arranged with respect to a collimated beam of light so that each thin film filter transmits light of a particular wavelength to a detector unit responsive to an angle of incidence of light upon the thin film filter when the thin film filter optically interposes the collimated light beam. Each of the plurality of thin film filters is optically interposed periodically and rotated so that the angle of incidence of light from the first input unit upon the thin film filter varies when the thin film filter is optically interposed to scan the light by wavelength within a selected wavelength band into a detector unit for measurement.||04-09-2009|
Patent applications by LIGHTWAVES 2020, INC.