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LayTec GmbH
| LayTec GmbH Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20110064114 | PYROMETER ADAPTED FOR DETECTING UV-RADIATION AND USE THEREOF - A pyrometer that is adapted for detecting radiation in the range of 250 to 450 nm is disclosed. The pyrometer can be used for determining the temperature of a matter thermally emitting only ultraviolet-radiation. In particular, the pyrometer can include: a detector having an active area adapted for measuring thermal radiation, a longpass filter having a cut-off wavelength in the range of 400 to 450 nm, means adapted for alternately activating and deactivating the longpass filter, means adapted for measuring a first thermal radiation signal when the longpass filter is deactivated and adapted for measuring a second thermal radiation signal when the longpass filter is activated, and means adapted for determining a temperature corresponding to the measured thermal radiation from a difference of the first radiation signal and the second radiation signal. | 03-17-2011 |
| 20110063625 | Method and apparatus for real-time determination of curvature and azimuthal asymmetry of a surface - An apparatus for measuring a curvature of a surface ( | 03-17-2011 |
| 20100290500 | METHOD FOR CALIBRATING A PYROMETER, METHOD FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER AND SYSTEM FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTING WAFER - The present invention relates to a method for calibrating a pyrometer, a method for determining the temperature of a semiconducting wafer and a system for determining the temperature of a semiconducting wafer. | 11-18-2010 |
| 20100290046 | METHOD AND APPARATUS FOR DETERMINING THE LAYER THICKNESS AND THE REFRACTIVE INDEX OF A SAMPLE - The present invention relates to a method and an apparatus for determining the layer thickness and the refractive index of a sample. | 11-18-2010 |