| KRATOS ANALYTICAL LIMITED Patent applications |
| Patent application number | Title | Published |
|---|
| 20110139973 | TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD - The present invention is concerned with improving the focusing of ions having a particular mass to charge ratio by optimising the electric field for the focusing of ions having that particular mass to charge ratio. In particular, the stigmatic focusing of ions can be improved by adjusting a voltage applied to an ion-optical lens | 06-16-2011 |
| 20100270465 | Method and apparatus for thermalization of ions - A method of pulsing gas in a quadrupole ion trap to reduce excess internal energy of ions formed externally to the trap at high-vacuum conditions by laser desoprtion is disclosed. With pulsed gas introduction, pressures greater than those under which traps are normally operated can be achieved over a few milliseconds. Under these elevated pressure transients, the process of translational cooling is accelerated and ions undergo thermalized collisions before dissociation occurs. Minimization of uncontrolled fragmentation (thermalization) and enhanced sensitivity are observed at pressures exceeding a threshold of about 1 mTorr. | 10-28-2010 |
| 20100176288 | METHOD AND APPARATUS USEFUL FOR IMAGING - The present invention provides a method of generating ions from a sample, the method comprising the steps of (1) designating a plurality of sample target sites, and (2) for each of said plurality of sample target sites, generating ions from a plurality of locations associated with the sample target site, wherein said plurality of locations are selected automatically with reference to the said sample target site. Each of the plurality of sample target sites is associated with a discrete sample region, wherein the sample is part of a MALDI ion source and the plurality of discrete sample regions comprise regions of matrix, suitably formed by chemical inkjet printing. The plurality of locations can be at least 5 and preferably at least 10 locations, each of which can be selected randomly or in accordance with a predetermined pattern. Ions generated from the plurality of locations associated with each of the sample target sites are assigned only a single set of sample position coordinates, which coordinates correspond to those of the sample target site. This averaging technique leads to improved data reliability. | 07-15-2010 |
