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Korea Institue of Machinery & Materials

Korea Institue of Machinery & Materials Patent applications
Patent application numberTitlePublished
20100019145Apparatus of Measuring the Orientation Relationship Between Neighboring Grains Using a Goniometer in a Transmission Electron Microscope and Method for Revealing the Characteristics of Grain Boundaries - An apparatus and method for measuring the crystallographic orientation relationship of neighboring grains and the characteristics of grain boundaries using a goniometer of a transmission electron microscope are disclosed to check the orientation relationship between two crystals and the characteristics of grain boundaries with a small error in real time. An apparatus for measuring the orientation relationship between neighboring grains and the characteristics of grain boundaries by using a goniometer of a transmission electron stereoscope, the apparatus comprising a goniometer mounted at a transmission electron microscope and a measurement unit for revealing the characteristics of grain boundaries of a specimen by linear-algebraically interpreting the relationship between crystal axes and tilt axes of the specimen using the goniometer.01-28-2010