| KONICA MINOLTA SENSING, INC. Patent applications |
| Patent application number | Title | Published |
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| 20110222065 | Reflection characteristic measuring apparatus for sheet specimen, method of calibratingreflection characteristic measuring apparatus for sheet specimen, and calibrationreference plate for use in calibration of reflection characteristic measuring apparatus forsheet specimen - A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported. | 09-15-2011 |
| 20110019192 | SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, AND DATA PROCESSING DEVICE - An object of the present invention is to provide a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing apparatus, and a program, which make it possible to appropriately correct an influence of an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission, in a scanning type color measurement system or the like which sequentially measures many color samples | 01-27-2011 |
| 20080225291 | CONCAVE DIFFRACTION GRATING DEVICE, REFLECTIVE DISPERSION DEVICE, AND SPECTRAL DEVICE - A concave diffraction grating device, a reflective dispersion device, and a spectral device of the invention include a diffraction grating plane having an aspherical configuration, wherein the diffraction grating plane is symmetrical in a predetermined direction, and asymmetrical in a direction orthogonal to the predetermined direction in such a manner that the curvature of one end portion of the diffraction grating plane in the direction orthogonal to the predetermined direction is gradually decreased, and the curvature of the other end portion thereof is gradually increased. The concave diffraction grating device, the reflective dispersion device, and the spectral device with the above arrangement have desirable slit image forming performance with respect to all the wavelengths in a visible region, and are suitable for mass-production. | 09-18-2008 |
| 20080212092 | WAVELENGTH DISPLACEMENT CORRECTING SYSTEM - In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and information relating to the dispersed light image of the incident slit is outputted from the spectral device. A wavelength displacement amount of the monochromatic beam is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width displacement amount of the spectral device is calculated, using the calculated wavelength displacement amount of the monochromatic beam, and the calculated wavelength displacement amounts of at least two diffracted beams, whereby a wavelength displacement of the spectral device is corrected. | 09-04-2008 |
