| KINGSTON TECHNOLOGY CORP. Patent applications |
| Patent application number | Title | Published |
|---|
| 20110300752 | THUMB DRIVE CHASSIS STRUCTURE - A thumb drive with a miniaturized memory storage assembly package that employs an extended chassis structure to support the miniaturized memory device within an ergonomically designed casing that is also simple to manufacture. The miniaturized memory storage assembly has a flexible latch projection extending from its side that mates with a complimentary latch aperture in the side of the connector housing. Downwardly projecting tongues in the top surface of the connector housing also prevent movement of the assembly within the housing. The elongated platform chassis extending rearwardly from the USB connector housing snaps in place in an ergonomically designed thumb drive case. | 12-08-2011 |
| 20110298486 | Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading - A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors. | 12-08-2011 |
| 20110193585 | CONVEYOR-BASED MEMORY-MODULE TESTER WITH ELEVATORS DISTRIBUTING MOVING TEST MOTHERBOARDS AMONG PARALLEL CONVEYORS FOR TESTING - A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns. | 08-11-2011 |
| 20110050268 | Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading - A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors. | 03-03-2011 |
| 20100274517 | Chip Handler with a Buffer Traveling between Roaming Areas for Two Non-Colliding Robotic Arms - Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch. | 10-28-2010 |
| 20100218050 | Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading - A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors. | 08-26-2010 |
| 20100213027 | Conveyor-Based Memory-Module Tester with Elevators Distributing Moving Test Motherboards Among Parallel Conveyors For Testing - A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns. | 08-26-2010 |
| 20090301909 | Credit-Card-Sized Carrier of Both Standard and Micro Form-Factor Flash-Memory Cards - A multi-standard flash-memory-card carrier is about the same size as a thick credit card and fits into a wallet. The multi-standard flash-memory-card carrier has bays that accept flash-memory cards. Larger bays on one side receive SD cards and a Memory Stick Duo card, while micro bays on another side of the carrier receive microSD cards and Memory Stick Micro cards. A carrier spine sandwiched between top and bottom covers has openings forming the bays. Spring-clip tabs on spring-clip fingers fit into notches on the side of the flash-memory cards to secure the flash-memory cards into the multi-standard flash-memory-card carrier to prevent loss. The spring-clip fingers are movable parts of the carrier spine that are deformed during insertion of the flash-memory cards. Both micro and standard flash-memory cards can be carried in the same multi-standard flash-memory-card carrier that can be placed in plastic sleeves for credit cards in a person's wallet. | 12-10-2009 |
| 20090217102 | Fault Diagnosis of Serially-Addressed Memory Chips on a Test Adaptor Board To a Middle Memory-Module Slot on a PC Motherboard - A standard memory module socket is removed from a target DRAM module slot on the component side and the test adaptor board connects to the target DRAM module slot on the reverse (solder) side of a personal computer motherboard, or an extender card may be used. The target DRAM module slot is a middle slot, such as the second or third of four DRAM module slots. The first and fourth DRAM module slots are populated with known good memory modules storing the BIOS at a high address and an operating system image and a test program at a low address. The test program accesses a memory chip in a test socket on a test adaptor board that is connected to the target DRAM module slot to locate defects. The motherboard does not crash since the BIOS, OS image, and test program are not stored in the memory chip under test. | 08-27-2009 |
| 20090217093 | Fault Diagnosis of Serially-Addressed Memory Modules on a PC Motherboard - A test adaptor board connects to a personal computer (PC) motherboard that tests a memory module in a test socket. A standard memory module socket is removed from a target DRAM module slot on the component side and the test adaptor board connects to the target DRAM module slot on the reverse (solder) side of the motherboard. The target DRAM module slot is a middle slot, such as the second or third of four DRAM module slots. The first and fourth DRAM module slots are populated with known good memory modules storing the BIOS at a high address and an operating system image and a test program at a low address. The test program accesses a memory module in the test socket to locate defects. The motherboard does not crash since the BIOS, OS image, and test program are not stored in the memory module under test. | 08-27-2009 |
| 20090138119 | Chip Handler with a Buffer Traveling between Roaming Areas for Two Non-Colliding Robotic Arms - Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front position, a first robotic arm loads IC chips from an input tray or stacker into buffer cavities in the traveling buffer. The traveling buffer then moves along the x-tracks to the back position, where a second robotic arm moves chips from the traveling buffer to test boards for testing. After testing, the second robotic arm moves chips to a second traveling buffer, which then moves along tracks to a front position for unloading by the first robotic arm. Two traveling buffers may move on the same tracks in a loop. The buffer cavities in the traveling buffer move on internal tracks to expand and contract spacing and pitch between the front and back positions to match test-board pitch. | 05-28-2009 |
