| KDE CORPORATION Patent applications |
| Patent application number | Title | Published |
|---|
| 20110141270 | INSPECTION SYSTEM - An inspection system is provided that can calculate highly accurate data for inspection having a high S/N ratio with high freedom. In order to attain this, an imaging timing is adjusted to synchronize a time for a projected image of an object to move by “m” pixels (“m” is an integer number greater than or equal to 1) in the X-axis direction on imaging elements, with an imaging time interval, and partial image data imaged at the identical inspection position on the object is specified from each unit of two-dimensional image data based on the object appearing deviated by “m” pixels in the X-axis direction in each unit of the two-dimensional image data imaged at each of the imaging timings, and data for inspection in which a noise reducing processing is conducted at the inspection position is produced based on each section of the partial image data. | 06-16-2011 |
| 20110069320 | INSPECTING SYSTEM AND INSPECTING METHOD - An object of the present invention is to apply a phase shift method to a workpiece having a rough surface to accurately detect an abnormal concave-convex irregularity. Therefore, in an inspecting system of the present invention, an image of a stripe pattern reflected on an inspection target surface is detected at a shallow angle, and one or more continuous unit stripes of a unit stripes reflected image is specified among from the stripe pattern reflected images existing in a predetermined distance range counted from the edge in a closer side to the workpiece. Then, the phase of the specified unit stripes reflected image is varied to apply a phase shift method and scan the inspection target surface with the unit stripes reflected image to thereby detect the abnormal concave-convex irregularity. | 03-24-2011 |
