| 20090157340 | Method and system for yield enhancement - Aspects of the disclosure provide a method for calibrating a circuit performance. The method can stabilize the circuit performance over time, and maintain the circuit performance substantially in a specification independent of various variation sources. Therefore, chip reliability can be improved and high product yield can be achieved. The method for calibrating the circuit performance can include assigning levels to a set of circuit parameters of a circuit, measuring values of the circuit parameters during operation of the circuit, generating a control signal that corresponds to the measured circuit parameters weighted according to the assigned levels, and adjusting a feedback relationship of a feedback loop circuit of the circuit in a close loop feedback system according to the control signal so as to change the circuit performance. | 06-18-2009 |
