KABUSHHIKI KAISHA TOSHIBA Patent applications |
Patent application number | Title | Published |
20120187300 | METHOD FOR OPTIMIZING STEP SIZE IN A MULTI-STEP WHOLE-BODY PET IMAGING - A method of imaging a region of interest (ROI) in an object, the ROI having an axial extent greater than an axial FOV of a PET scanner. The method includes determining a number of overlapping scans of the PET scanner necessary to image at least the axial extent of the ROI, wherein each scan has a same axial length equal to the axial FOV, and each scan overlaps an adjacent scan by a predetermined overlap percentage of the axial length of each scan. Further, the method includes determining a total amount of excess scanning length of the scans based on the number, the axial extent of the ROI, and the axial FOV, and determining a new overlap percentage based on the total amount of excess scanning length and the predetermined overlap percentage, so that a new total amount of excess scanning length, as determined with the new overlap percentage, is zero. | 07-26-2012 |
20120123237 | MEDICAL IMAGING SYSTEM THAT REDIRECTS HEAT WASTE FOR PATIENT PALLET HEATING - According to certain embodiments, a medical imaging system includes an imager, a patient pallet, and a heating subsystem. The imager obtains measurement data of a patient. Further, the imager includes at least one electrical component that generates heat. The patient pallet supports the patient to be scanned by the imager. Further, the heating subsystem heats the patient pallet using the heat generated by the at least one electrical component of the imager. | 05-17-2012 |
20120099365 | THREE DIMENSIONAL PROGRAMMABLE RESISTANCE MEMORY DEVICE WITH A READ/WRITE CIRCUIT STACKED UNDER A MEMORY CELL ARRAY - A programmable resistance memory device includes a semiconductor substrate, at least one cell array, in which memory cells are arranged formed above the semiconductor substrate. Each of the memory cells has a stack structure of a programmable resistance element and an access element, the programmable resistance element storing a high resistance state or a low resistance state determined due to the polarity of voltage application in a non-volatile manner. The access element has such a resistance value in an off-state in a certain voltage range that is ten time or more as high as that in a select state. A read/write circuit is formed on a semiconductor substrate as underlying the cell array for data reading and data writing in communication with the cell array. | 04-26-2012 |
20120066529 | INFORMATION PROCESSING APPARATUS AND METHOD FOR CONTROLLING POWER SUPPLY OF THE APPARATUS - An information processing apparatus includes an information processing unit, an interface supplying electrical power to and communicating a signal with an external electronic device through a single connector, a unit supplying electrical power to the electronic device through the interface and including a rechargeable battery. Detection units detect a connection of the electronic device to the apparatus, an external power supply. The power supply control, when the connections are detected, keeps supplying electrical power to the electronic device through the interface even after deactivation of the apparatus, in the event an instruction to turn off a power supply of the apparatus or deactivate the apparatus is issued. When the connection of the external power supply for charging the rechargeable battery to the apparatus is not detected, the power supply does not supply electrical power to the electronic device even during operation of the apparatus. | 03-15-2012 |
20110096324 | RETICLE DEFECT INSPECTION APPARATUS AND RETICLE DEFECT INSPECTION METHOD - A reticle defect inspection apparatus that can carry out a defect inspection with high detection sensitivity are provided. The apparatus includes an optical system of transmitted illumination for irradiating one surface of a sample with a first inspection light, an optical system of reflected illumination for irradiating another surface of the sample with a second inspection light, and a detecting optical system that can simultaneously detect a transmitted light obtained by the first inspection light being passed through the sample and a reflected light obtained by the second inspection light being reflected by the sample. And the optical system of transmitted illumination includes a focusing lens driving mechanism for correcting a focal point shift of the transmitted light resulting from thickness of the sample. | 04-28-2011 |
20080311486 | PHOTOMASK MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD - A photomask manufacturing method. A pattern dimensional map is generated by preparing a photomask in which a reflective layer formed on a substrate and an absorber pattern is formed on the layer. A reflection correction coefficient map is generated by dividing a mask region, where the absorber pattern is formed, into a plurality of subregions, and determining a reflection correction coefficient for each subregion. The reflection correction value of each subregion is calculated based on the dimensional difference indicated in the pattern dimensional map and the reflection correction coefficient of each subregion. A reflection coefficient of each reflective layer region corresponding to each subregion is changed based on the reflection correction value. | 12-18-2008 |
20080309607 | LIQUID CRYSTAL DISPLAY DRIVER AND LIQUID CRYSTAL DISPLAY DEVICE - A driver includes a delay-time adjuster. A data clock is inputted to the delay-time adjuster through a data-clock signal line. While receiving input of a load signal that is a sampling signal of a second register, the delay-time adjuster adjusts a delay time of the data clock so that a phase difference between the data clock and gradation data inputted into a first register through a gradation-data signal line can be set to a predetermined value. After the completion of the input of the load signal, the delay-time adjuster holds a data clock for the adjusted delay time, and outputs the delayed data clock as a shift clock for a shift register. | 12-18-2008 |