| 20090185160 | MEASURING DEVICE FOR DETERMINING THE SIZE, SIZE DISTRIBUTION AND QUANTITY OF PARTICLES IN THE NANOSCOPIC RANGE - The present invention relates to a measuring device to determine the size, size distribution and/or concentration of nanoscopic particles or hollow spaces in a measuring sample, the degree of opacity of such measuring samples, or the degree of roughness of surfaces by determining the wavelength and scattering angle dependent intensities of a measuring radiation scattered on a measuring sample, comprising a retaining device for a measuring sample to be measured, a detector, comprising at least one detector inlet, an evaluation unit and at least two radiation sources, which are respectively at a distance from each other and at a distance from the measuring sample, which comprise a multiple wavelength spectrum or a continuous spectrum, and the radiation intensities of which are adjustable and/or determinable, wherein via the radiation sources one ray bundle can in each case be emitted in an essentially parallel beam in the direction of a measuring sample, and wherein the ray bundles which can be directed onto the measuring sample, which have different radiation sources in relation to the axis between the detector inlet and the measuring sample, are aligned or can be aligned in different angles onto the measuring sample. | 07-23-2009 |
