Inventors list

Assignees list

Classification tree browser

Top 100 Inventors

Top 100 Assignees


JIREH INDUSTRIES LTD.

JIREH INDUSTRIES LTD. Patent applications
Patent application numberTitlePublished
20100326220MODULAR SCANNER APPARATUS AND PROBE HOLDING APPARATUS FOR INSPECTION - There is provided a modular scanner and probe holding apparatus for inspection, which consists of an assembly of a plurality of connective links rigidly connected. The connective links are added or removed from the assembly to size the assembly so the assembly extends more than half way around a circumference of a tubular body to be inspected. At least one tail link is connected to an end of the assembly. The tail link is biased by a spring to apply a force against the tubular body to hold the assembly in place. A probe holder link is provided that connects to the connective links and has a probe holder for holding a probe.12-30-2010