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JFE TECHNO-RESEARCH CORPORATION
Tokyo, JP
| JFE TECHNO-RESEARCH CORPORATION Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20090141287 | Surface-distortion Measuring Device and Method - A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means | 06-04-2009 |