| ION-TOF TECHNOLOGIES GMBH Patent applications |
| Patent application number | Title | Published |
|---|
| 20120104249 | MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMETER OF THIS TYPE - The invention relates to a mass spectrometer comprising an ion source for producing a primary ion beam, which has a heatable ion emitter coated by a liquid metal layer essentially comprised of pure metallic Bismuth or of a low-melting-point alloy containing, in essence, Bismuth. A Bismuth ion mixed beam can be emitted by the ion emitter under the influence of an electric field. From the Bismuth ion mixed beam, one of a number of Bismuth ion types whose mass is a multiple of monatomic singly or multiply charged Bismuth ions Bi | 05-03-2012 |
| 20100237234 | LIQUID METAL ION SOURCE, SECONDARY IION MASS SPECTROMETER,SECONDARY ION MASS SPECTROMETRIC ANALYSIS METHOD AND USE THEREOF - A mass spectrometric method according to the Gentle SIMS (G-SIMS) method uses a liquid metal ion source which contains, on the one hand, a first metal with an atomic weight ≧190 U and, on the other hand, another metal with an atomic weight ≦90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam. | 09-23-2010 |
