Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
INTERUNIVERSITAIR MICROELECKTRONICA CENTRUM VZW
| INTERUNIVERSITAIR MICROELECKTRONICA CENTRUM VZW Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20080312517 | Sensor for Eliminating Undesired Components and Measurements Method Using Said Sensor - In the present invention a novel method and device for measuring characteristics from a relatively weak signal comprising desired and undesired components is presented. Undesired signals may arise from the nature of the characteristic, from the detector or from the circuitry. The signal is extracted from a first measurement element ( | 12-18-2008 |