| INTERNATIONAL TRADING & TECHNOLOGY CO., LTD. Patent applications |
| Patent application number | Title | Published |
|---|
| 20110018572 | SEMICONDUCTOR DEVICE TEST SYSTEM - A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator-functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header. | 01-27-2011 |
| 20100262397 | MULTIPLY APPARATUS FOR SEMICONDUCTOR TEST PATTERN SIGNAL - An apparatus for multiplying a semiconductor test pattern signal is disclosed. The multiplying apparatus firstly encodes a plurality of pattern signals to have different pattern types, and multiplies the encoded pattern signals according to an exclusive-OR (XOR) scheme in order to generate a single pattern signal, thereby recognizing a relationship between a pattern signal before the multiplication and the other pattern signal after the multiplication. A pattern-signal segmenting/outputting unit segments a semiconductor test pattern signal into a plurality of pattern signals, and simultaneously outputs the segmented pattern signals. A pattern-signal restoring/multiplying unit restores the segmented pattern signals received from the pattern-signal segmenting/outputting unit to the semiconductor test pattern signal, outputs the restored result to a driver which records a test pattern in an objective semiconductor to be tested, and multiplies the signal outputted to the driver by a predetermined frequency band rather than a frequency band of the segmented signals. | 10-14-2010 |
