| INTERNATIONAL BUSINESS MACHINES CORPERATION Patent applications |
| Patent application number | Title | Published |
|---|
| 20080291970 | ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD - A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clamping device. The clamping device selectively shunts current from the constant current source or allows the current to flow through a PN junction, which may be the body to source/drain junction of a field effect transistor (FET). Voltage measurements are taken directly from the PN junction. Junction temperature is determined from measured junction voltage. | 11-27-2008 |
| 20080270864 | DIFFERENCE SIGNAL PATH TEST AND CHARACTERIZATION CIRCUIT - A test circuit and programmable voltage divider that may be used in the test circuit. The programmable voltage divider develops a voltage difference signal that may be digitally selected. The test circuit may be used to test and characterize sense amplifiers. The programmable voltage divider develops a signal with a selected polarity and magnitude that is provided to a sense amplifier being tested. The sense amplifier is set and its output latched. The latch contents are checked against an expected value. The difference voltage may be changed and the path retested to find passing and failing points. | 10-30-2008 |
| 20080229068 | ADAPTIVE FETCH GATING IN MULTITHREADED PROCESSORS, FETCH CONTROL AND METHOD OF CONTROLLING FETCHES - A multithreaded processor, fetch control for a multithreaded processor and a method of fetching in the multithreaded processor. Processor event and use (EU) signals are monitored for downstream pipeline conditions indicating pipeline execution thread states. Instruction cache fetches are skipped for any thread that is incapable of receiving fetched cache contents, e.g., because the thread is full or stalled. Also, consecutive fetches may be selected for the same thread, e.g., on a branch mis-predict. Thus, the processor avoids wasting power on unnecessary or place keeper fetches. | 09-18-2008 |
| 20080203980 | PROGRAMMABLE VOLTAGE DIVIDER - A test circuit and programmable voltage divider that may be used in the test circuit. The programmable voltage divider develops a voltage difference signal that may be digitally selected. The test circuit may be used to test and characterize sense amplifiers. The programmable voltage divider develops a signal with a selected polarity and magnitude that is provided to a sense amplifier being tested. The sense amplifier is set and its output latched. The latch contents are checked against an expected value. The difference voltage may be changed and the path retested to find passing and failing points. | 08-28-2008 |
