Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
INSTITUT FUER AKUSTOMIKROSKOPIE DR. KRAEMER GMBH
| INSTITUT FUER AKUSTOMIKROSKOPIE DR. KRAEMER GMBH Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20110061465 | METHOD AND APPARATUS FOR NON-DESTRUCTIVE DETECTION OF DEFECTS IN THE INTERIOR OF SEMICONDUCTOR MATERIAL - A method and an apparatus for the non-destructive detection of defects in the interior of semiconductor material ( | 03-17-2011 |