| INOVYS CORPORATION Patent applications |
| Patent application number | Title | Published |
|---|
| 20100031092 | METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FAILURE ANALYSIS - A method for operating a secure semiconductor IP access server to support failure analysis. A client presents a test failure and failure type to an automated server which traverses an electronic product design, definition, and test database to report specifically those components and interconnect likely to cause the failure with geometrical information which may be displayed on the client. Other aspects of semiconductor IP are protected by the server by limiting the trace mechanism and renaming components. | 02-04-2010 |
| 20090132870 | DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING - A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs. | 05-21-2009 |
| 20090113265 | LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS ON ATE - A method for determining that failures in semiconductor test are due to a defect potentially causing a hold time violation in a scan cell in a scan chain, counting the number of potential defects, and, if possible, localizing, and ameliorating hold time defects in a scan chain. | 04-30-2009 |
| 20080209288 | APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGITAL LOGIC - An apparatus for locating a defect in a scan chain by recording the last bit position in a serial data stream at which a certain data state is observed during a test comprising a plurality of patterns. | 08-28-2008 |
