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INNOVISION INC
| INNOVISION INC Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20110176768 | OPTICAL SPECTRAL FILTER, ANGULAR FILTER AND POLARISER - A filter and fabrication process for a thin film filter that is based on frustrated total internal reflection and multiple waveguide layers, in which the waveguide modes are resonantly coupled. The physics of the design is related to prism coupling of light into planar waveguides, and waveguide coupling between planar waveguides in close proximity. Embodiments include a filter that acts as a bandpass filter and polarizer, a filter that acts as a bandpass filter, polarizer and angle filter (spatial filter), a filter that is widely tunable, and a filter that is widely tunable in both peak transmission wavelength and width. Methods of fabrication are disclosed, and methods to correct for manufacturing errors in thin film deposition are described. The filter embodiments can also be used in reflection as notch filters in wavelength and angle, for a particular polarization component. | 07-21-2011 |
| 20100182606 | APPARATUS AND METHOD FOR MULTI-PARAMETER OPTICAL MEASUREMENTS - An apparatus and method are provided for optically measuring multiple parameters of a test sample at a regulated temperature. The test sample is held in a cuvette within a sample chamber or a fluidic channel on a fluidic chip. The temperature is sensed and modulated within a desired range. Either excitation light is directed through the test sample, and the emitted light is detected by a detector which converts the detected emission light into an output signal; or a probe light is directed to the test sample and at a detector. The output signal is transmitted to the control system which converts the output signal into output data representative of the fluorescence intensity, optical density and/or refractive index of the test sample. | 07-22-2010 |