| INFINITESIMA LTD Patent applications |
| Patent application number | Title | Published |
|---|
| 20110296561 | CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPE - A control system ( | 12-01-2011 |
| 20110247106 | DYNAMIC PROBE DETECTION SYSTEM - A dynamic probe detection system ( | 10-06-2011 |
| 20110167525 | PROBE DETECTION SYSTEM - A probe detection system ( | 07-07-2011 |
| 20110138506 | METHOD OF PROBE ALIGNMENT - A method of probe alignment is described in which an interrogating light beam is aligned with the probe of a scanning probe microscope. The methods described ensure that the light beam is positioned as closely as possible to a point directly above the probe tip. This improves image quality by removing variations that may arise if cantilever deflection is allowed to vary during the course of a scan and/or if scanning at high scanning speeds that may excite transient motion of the probe. | 06-09-2011 |
| 20100235955 | VIBRATION COMPENSATION IN PROBE MICROSCOPY - A The local probe microscopy apparatus ( | 09-16-2010 |
| 20100186132 | PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE - A probe assembly is for use in a scanning probe microscope. The probe assembly includes a carrier having a plurality of at least three substantially identical probes, each probe having a tip that is located on a plane that is common to the plurality of probe tips and that is movable from this plane. The assembly also includes addressing means adapted to select one of the plurality of probes for relative movement with respect to a majority of the remainder of the probes. Such an assembly, with its potential to facilitate rapid, perhaps automated, replacement of a used probe, lends itself to use in high-speed scanning apparatus. | 07-22-2010 |
