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HYNIX SEMICONDUCTOR

HYNIX SEMICONDUCTOR Patent applications
Patent application numberTitlePublished
20100124810Nonvolatile Memory Device and Fabrication Method Thereof - A nonvolatile memory device and its fabrication method of the present invention may ensure a margin of the threshold drive voltage during a design process of the device by forming a resistance layer determining phase of ReRAM along an upper edge of a lower electrode, and improve operating characteristics of the device05-20-2010
20090096010NONVOLATILE MEMORY DEVICE AND FABRICATION METHOD THEREOF - A nonvolatile memory device and a fabrication method thereof are disclosed. The nonvolatile memory device comprises a tunnel insulating film formed on an active region of a semiconductor substrate, a first conductive layer for a floating gate formed on the tunnel insulating film, a dielectric layer formed on the first conductive layer, a second conductive layer for a control gate formed on the dielectric layer, an etch-stop layer formed on the second conductive layer, and a gate electrode layer formed on the etch-stop layer. Accordingly, there is no difference in the degree to which the conductive layer under the gate electrode layer is etched when etching the gate electrode layer of the memory cell region and the peri region.04-16-2009