| HORIBA JOBIN YVON SAS Patent applications |
| Patent application number | Title | Published |
|---|
| 20120127577 | PLANAR OPTICAL SYSTEM FOR WIDE FIELD-OF-VIEW POLYCHROMATIC IMAGING - A planar optical system for wide field-of-view polychromatic imaging includes a planar waveguide including two plane parallel faces, an entry coupler including a first diffraction grating, and an exit coupler including a second diffraction grating. The diffraction gratings are low line density diffraction gratings that have a pitch greater than the wavelength of use such that the grating is adapted to couple an entry beam having a mean angle of incidence i | 05-24-2012 |
| 20120093191 | METAL DIFFRACTION GRATING WITH HIGH REFLECTION RESISTANCE TO A FEMTOSECOND MODE FLOW, SYSTEM INCLUDING SUCH AN GRATING, AND METHOD FOR IMPROVING THE DAMAGE THRESHOLD OF A METAL DIFFRACTION GRATING - A reflection metal diffraction grating has a high diffraction efficiency for diffracting femtosecond mode laser pulses, and includes a substrate with a set of lines having a pitch Λ. The substrate is made of metal or covered with a metal layer, and the grating includes a thin film of dielectric material having a thickness, the dielectric film covering the metal surface of the lines of the grating, the grating being suitable for receiving a pulsed electromagnetic lightwave in a femtosecond mode. The thickness of the dielectric thin film is lower than 50 nm, and is suitable for reducing by a third order factor at least the maximum of the square of the electric field of the electromagnetic lightwave on the metal surface and in the metal layer of the substrate as compared to the square of the electric field at the surface of a metal grating not having a dielectric thin film. | 04-19-2012 |
| 20110291567 | DISCHARGE LAMP FOR GDS WITH AN AXIAL MAGNETIC FIELD - A glow discharge spectrometer discharge lamp includes: a lamp body having a vacuum enclosure connected to pump elements and to injector elements for injecting an inert gas into the enclosure; a hollow cylindrical first electrode of longitudinal axis X-X′; a second electrode for receiving a sample for analysis and for holding the sample facing one end of the cylindrical electrode; electric field generator including an applicator for applying to the terminals of the electrodes an electric field that is continuous, pulsed, radiofrequency, or hybrid, and suitable for generating a glow discharge plasma in the presence of the gas; coupler elements for coupling the discharge lamp to a spectrometer suitable for measuring at least one component of the plasma; and magnetic field generator elements for generating a magnetic field having field lines oriented along the axis X-X′, the magnetic field being uniform in orientation and in intensity over an area of the sample that is not less than the inside area of the hollow cylindrical electrode as projected along the direction X-X′. | 12-01-2011 |
| 20110222061 | DYSON-TYPE IMAGING SPECTROMETER HAVING IMPROVED IMAGE QUALITY AND LOW DISTORTION - A Dyson imaging spectrometer includes an entry port extending in a direction X, an exit port, a diffraction grating including a set of lines on a concave support, an optical system including a lens, the lens including a plane first face and a convex second face, the convex face of the lens and the concave face of the diffraction grating being concentric, the optical system being adapted to receive an incident light beam coming from the entry port and to direct it toward the diffraction grating, to receive a beam diffracted by the diffraction grating, and to form a spectral image of the diffracted beam in a plane of the exit port, the spectral image being adapted to be spatially resolved in an extension direction X′ of the image of the entry port. The diffraction grating includes a set of non-parallel and non-equidistant lines and/or the support of diffraction grating is aspherical in order to form an image of the entry port in the exit plane of improved image quality and of very low distortion. | 09-15-2011 |
| 20110205539 | DEVICE AND METHOD FOR TAKING SPECTROSCOPIC POLARIMETRIC MEASUREMENTS IN THE VISIBLE AND NEAR-INFRARED RANGES - A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16| 08-25-2011 | |
| 20100134792 | SPECTROSCOPIC IMAGING METHOD AND SYSTEM FOR EXPLORING THE SURFACE OF A SAMPLE - A spectroscopic imaging system includes a microscopic or macroscopic device including an objective, a housing including a spectroscope, and scanning means disposed between the objective and the spectroscope. During the scanning of the excitation beam on a scanned area on the sample surface, the energy of the emitted light beam is integrated on the pixels of the detection means, generating average spectral data for each line of pixels. Storage means are connected to the detection means, including a memory able to store average spectral data of M lines of pixels. An imaging device is connected to the storage means, and the average spectral data of M lines of pixels are sent simultaneously toward the imaging device in order to obtain an average spectroscopic image of the scanned area. | 06-03-2010 |
| 20100118299 | INCLINED-SLIT SPECTROGRAPH - An inclined-slit spectrograph includes a light source, an inlet slit, a grating and a detector including window through which the light beam diffracted by the grating is transmitted with part of the diffracted light beam generating reflections on the window or between the window and the sensitive surface of the detector. A rectangular inclined inlet slit compensates for spectral resolution losses. | 05-13-2010 |
| 20100110427 | SYSTEM AND PROCESS FOR ANALYZING A SAMPLE - A system and process for analyzing a sample includes an excitation section and an analyze section, said excitation section including a light source emitting an incident measurement luminous beam, a polarisation state generator (PSG), first optics, and said analyze section includes a polarisation state analyzer (PSA), a detection system and second optics. The excitation section includes an illumination source emitting an incident visualization luminous beam, superposition optics that direct the incident visualization luminous beam toward the sample surface along an optical axis which is identical to the optical axis of the incident measurement luminous beam and the analyze section includes separation optics that transmit a part of the reflected or transmitted visualization luminous beam and a part of the reflected or transmitted measurement luminous beam towards a visualization direction. | 05-06-2010 |
