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Hitachi Kyowa Engineering Co., Ltd.
| Hitachi Kyowa Engineering Co., Ltd. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100043108 | PROBE FOR SCANNING PROBE MICROSCOPE - In a tip having a carbon nanotube tip used to a scanning probe microscope, its length of the tip is adjusted in a several order of 10 nm and the tip maintains cylindrical shape up to the extremity portion. | 02-18-2010 |