HERMES TESTING SOLUTIONS INC. Patent applications |
Patent application number | Title | Published |
20140125371 | STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING - A probe card includes at least two connection arrangements on a printed circuit board and a daughter board connected to the printed circuit board through one of the connection arrangements. The daughter board includes a plurality of cell modules, with each of the cell modules having a socket for receiving a device under test and each of the connection arrangements of the printed circuit board being connectable to each of predetermined daughter boards respectively. | 05-08-2014 |
20100127722 | CIS Circuit Test Probe Card - A CIS test probe card with an optic assembly is disclosed. At least one embodiment relates to the optic assembly being located close to the CIS test probe card to collimate a light before it is projected through the CIS test probe card to the wafer. At least one embodiment relates to a change in the geometric configuration of the hole(s) and the probe(s) in the CIS test probe card. Small holes corresponding to the CIS chips in a one-on-one fashion can be implemented, such that each small hole is located over a corresponding CIS chip. | 05-27-2010 |