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Hch. Kuendig & Cie. AG

Hch. Kuendig & Cie. AG Patent applications
Patent application numberTitlePublished
20110161036Method For Measuring The Thickness Of Multi-Layer Films - The invention relates to a method for determining the thickness of multi-layer films (06-30-2011
20100141274Method for Measuring the Thickness of Multi-Layer Films - The invention relates to a method for determining the thickness of multi-layer films (06-10-2010