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HANWA ELECTRONIC IND. CO., LTD

Wakayama, JP

HANWA ELECTRONIC IND. CO., LTD Patent applications
Patent application numberTitlePublished
20100156447Method for Calibrating a Transmission Line Pulse Test System - Calibration method for calibrating transient behaviour of a TLP test system. The system comprises a TLP generator, probe needles, nominally impedance matched transmission lines and measurement equipment, connected between the transmission lines and the TLP generator, for detecting transient behaviour of a device under test by simultaneously capturing voltage and current waveforms as a result of generated pulses. The calibration method comprises (a) applying the TLP test system on an open and capturing first voltage and current waveforms; (b) applying the TLP test system on a calibration element having a known finite impedance and a known transient response and capturing second voltage and current waveforms; (c) transforming the captured first and second current and voltage waveforms to the frequency domain, and (d) determining calibration data for the transient behaviour of the TLP test system on the basis of the transformed first and second voltage and current waveforms.06-24-2010
20100090710IMPULSE IMMUNITY TEST APPARATUS - The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform.04-15-2010