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GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC

GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC Patent applications
Patent application numberTitlePublished
20120105429METHOD AND SYSTEM FOR HIGH-SPEED, HIGH-RESOLUTION 3-D IMAGING OF MANUFACTURED PARTS OF VARIOUS SIZES - A method and system for high-speed, high-resolution 3-D imaging of manufactured parts of various sizes at an imaging station having a measurement axis are provided. The part has a 3-D end surface and a length, a width and a part axis defined as being central to the part and parallel to its length. The system includes apparatus having a central axis substantially parallel to the measurement axis and a plurality of members having open and closed positions. The members have holding faces which are substantially equidistant from the central axis during movement between the positions to align a part disposed between the holding faces at the station so that the part axis is substantially parallel to the measurement and central axes. The holding faces releasably hold the aligned part in a holding position between the positions. The system further includes an actuator for moving the apparatus so that the end surface moves in a plane substantially perpendicular to the measurement axis. The system still further includes a controller for controlling the actuator to move the end surface along a 2-D trajectory within the plane. The system further includes at least one sensor for emitting a beam of energy along the measurement axis onto the end surface during movement of the end surface along the 2-D trajectory to obtain reflected energy and for sensing at least a portion of the reflected energy to obtain an output. The system still further includes a processor for processing the output to obtain information related to the end surface of the part.05-03-2012
20110043803METHOD AND SYSTEM FOR CENTERING AND ALIGNING MANUFACTURED PARTS OF VARIOUS SIZES AT AN OPTICAL MEASUREMENT STATION - A method and system for centering and aligning manufactured parts of various sizes at an optical measurement station are provided. The system includes apparatus having a central axis substantially parallel to the measurement axis and including a plurality of members having open and closed positions. The members have holding faces which are substantially equidistant from the central axis during movement between the open and closed positions. At least one of the members applies a force on an exterior side surface of a part disposed between the holding faces during movement between the positions to reposition the part at the station. The repositioned part is centered and aligned with respect to the measurement axis at the station. The holding faces releasably hold the repositioned part in a holding position between the open and closed positions at the station. The system further includes a movable stage subsystem coupled to the apparatus for translating the apparatus relative to the repositioned part along the central axis in the open position of the members to allow the exterior side surface of the repositioned part to be measured.02-24-2011
20100265324OPTICAL METHOD AND SYSTEM FOR GENERATING CALIBRATION DATA FOR USE IN CALIBRATING A PART INSPECTION SYSTEM - An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system. The calibration data is capable of converting raw data to calibrated data.10-21-2010
20100245850System For Indirectly Measuring A Geometric Dimension Related To An Opening In An Apertured Exterior Surface of A Part Based On Direct Measurements Of The Part When Fixtured At A Measurement Station - A system for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part such as an ammunition case based on direct measurements of the part when fixtured at a measurement station is provided. The system includes first and second holding devices for holding the part therebetween in a part-retaining position in which the part is firmly held between the devices at its end surfaces. In one embodiment, a portion of each of the holding devices extends into its respective opening in the part-retaining position. The system also includes a head apparatus which has a plurality of radiation sources for successively directing arrays of planes of radiation at the holding devices and at the part, and a plurality of receiver modules for measuring the amount of radiation present in unobstructed planar portions of the planes to obtain holding device and part signals. The system further includes a movable stage subsystem coupled to the head apparatus for translating the head apparatus. The system still further includes a signal processor for processing the holding device and part signals to obtain data and a data processor for processing the data to obtain the direct measurements. The data processor determines the geometric dimensions related to the openings based on the direct measurements.09-30-2010
20100201806METHOD AND SYSTEM FOR AUTOMATICALLY INSPECTING PARTS AND FOR AUTOMATICALLY GENERATING CALIBRATION DATA FOR USE IN INSPECTING PARTS - A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras. Each of the cameras measures the amount of radiation present in an adjacent pair of unobstructed planar portions created from the same plane of radiation to obtain at least one measurement signal. The system still further includes a stage subsystem including a stage movable along a stage axis substantially parallel to the measurement axis and coupled to the head apparatus to move therewith for translating the head apparatus relative to the part and/or device along the stage axis so that the planes of radiation scan the part and/or device supported by the support substantially perpendicular to the stage and measurement axes. The system may further include one or more mechanisms for reducing radiation cross talk between neighboring cameras.08-12-2010
20100073687Method For Precisely Measuring Position Of A Part To Be Inspected At A Part Inspection Station - A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is within the acceptable range of geometric values.03-25-2010
20100039655PROFILE INSPECTION SYSTEM FOR THREADED AND AXIAL COMPONENTS - A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In the preferred embodiment, the detector has a field of view wider than the width of the component, thereby enabling the detector to image a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component and a processor, in communication with the detector and the translation stage, is operative to: a) receive electrical signals representative of the outer profile imaged by the detector; b) move the translation stage incrementally along the length of the component; and c) record the outer profile imaged by the detector at each increment and form a composite profile of the component. In the preferred embodiment, the processor is further operative to record the composite profile of the component at one or more angular orientations by rotating the component through a predetermined angle about its axis.02-18-2010
20090103112Non-Contact Method And System For Inspecting Parts - A non-contact method and system for inspecting parts using two different types of machine vision methodologies are provided. The system has enhanced versatility and includes a triangulation-based subsystem to obtain triangulation-based sensor data, a radiation plane-based profile inspection subsystem to obtain shadowed radiation plane-based sensor data and a data processor for processing or fusing the triangulation-based sensor data and the shadowed radiation plane-based sensor data to obtain dimensional information related to the part.04-23-2009
20090103107Method And System For Inspecting Parts Utilizing Triangulation - A method and system for inspecting parts utilizing triangulation are provided. The system includes a part support subsystem including a fixture for supporting a part to be inspected and a head apparatus. The head apparatus includes at least one radiation source for directing a plane of radiation at the part so that the part occludes the plane of radiation to create unobstructed planar portions of the plane of radiation wherein each of the unobstructed planar portions of the plane of radiation contains an amount of radiation which is representative of a respective geometric dimension of the part. The head apparatus also includes at least one receiver module for measuring the amount of radiation present in each of the unobstructed planar portions and a triangulation-based sensor to illuminate the part with a beam of electromagnetic energy to obtain a reflected beam of electromagnetic energy and to sense at least one portion of the reflected beam of electromagnetic energy. The system further includes a movable stage subsystem coupled to the head apparatus for translating the head apparatus relative to the part so that the plane of radiation and the beam of electromagnetic energy linearly scan the part supported by the fixture and a controller for generating control signals to control linear movement of the stage subsystem during the linear scan.04-23-2009

Patent applications by GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC