Gemological Appraisal Association, Inc. Patent applications |
Patent application number | Title | Published |
20140063485 | GEMSTONE REGISTRATION SYSTEM AND SYSTEM FOR EVALUATING THE QUALITY OF A GEMSTONE CUT - A computer-implemented system is provided and includes a processor and a memory accessible by the processor, with the system being configured to measure light performance properties of a gemstone and generate an objective grade for the gemstone. The gemstone is analyzed with respect to a light return property, an optical symmetry property and a scintillation property of the gemstone and an objective grade for each is generated. | 03-06-2014 |
20130064459 | GEM PATTERN MATCHING ALGORITHM TO DETERMINE THE PERCENTAGE MATCH OF A TARGET GEM PATTERN TO A DATABASE OF GEM PATTERNS - A method and gem pattern matching technique to analyze a target gemstone by analyzing a pattern created by transmitting a light source such as a laser beam through the gemstone to create a visual optical pattern and comparing the pattern to a database of known gemstone patterns to determine the percentage likelihood that the target gemstone will match a gemstone in the database. The matching is based on the weight of the heaviest spot in the pattern and its location in the gemstone image and comparing it to the weight and location of the heaviest spots in each gemstone image in the database to determine a percentage matching. | 03-14-2013 |
20130010280 | GEMSTONE REGISTRATION SYSTEM - A device for producing a reproducible identification pattern of a polished gemstone includes light directing means for directing a focused beam of light onto a gemstone orientated in a particular known manner to produce an output of the internal refraction and reflection characteristics of the gemstone including reflected light beams having particular locations, sizes and intensities. The device also includes automated means for changing a position of the gemstone relative to the focused beam of light; and also a means for recording the output in a manner to record the relative size and location of the reflected light beams. | 01-10-2013 |