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Freescale Semicondutor

Freescale Semicondutor Patent applications
Patent application numberTitlePublished
20120017128SYSTEM FOR TREE SEQUENCE TESTING OF A DEVICE AND METHOD FOR TREE SEQUENCE TESTING OF A DEVICE IN A TEST FRAMEWORK ARCHITECTURE - A system comprises a test framework architecture for tree sequence testing of a device, comprising a plurality of hierarchical layers at least comprising an upmost layer and a lowest layer, each layer of the plurality of hierarchical layers comprising at least one of a plurality of test sequences, each test sequence comprising a plurality of test steps, each test step comprising a current layer information; a test action information for carrying out a test action on the device; and a recovery information for carrying out a recovery action on reception of a recovery call from a next lower layer.01-19-2012