FREESCALE SEMICONDUTOR INC Patent applications |
Patent application number | Title | Published |
20120092546 | DEGREE-OF-FOCUS DETERMINATION MODULE, POSITION-OF-BEST-FOCUS SELECTION MODULES, IMAGE PROCESSING MODULE, IMAGING SYSTEM, AND CORRESPONDING METHOD - A system for imaging a structure of an object is provided. The imaging system includes a degree-of-focus determination module that may comprise logic for taking into account at least one of a first and a second dimension of a topological element of the structure to be imaged. An image processing module of the system may comprise: a control module for controlling a motorized focus driver; a memory for storing images; and said degree-of-focus determination module. The imaging system may comprise: a stage; a motorized focus driver for driving the stage; at least one of microscope optics, a lens, an illumination system; a camera; and an image processing module. | 04-19-2012 |
20090170306 | PROCESS FOR FILLING RECESSED FEATURES IN A DIELECTRIC SUBSTRATE - A process for filling recessed features of a dielectric substrate for a semiconductor device, comprises the steps (a) providing a dielectric substrate having a recessed feature in a surface thereof, wherein the smallest dimension (width) across said feature is less than ≦200 nm, a conductive layer being present on at least a portion of said surface, (b) filling said recessed feature with a conductive material, and (c) prior to filling said recessed feature with said conductive material, treating said surface with an accelerator. | 07-02-2009 |