FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG ANGEWANDTEN FORSCHUNG E.V. Patent applications |
Patent application number | Title | Published |
20140199014 | ELECTRO-OPTIC MACH-ZEHNDER MODULATOR AND METHOD FOR FABRICATING AN ELECTRO-OPTIC MACH-ZEHNDER MODULATOR - An electro-optic Mach-Zehnder modulator includes a first optical waveguide forming a first arm of the Mach-Zehnder modulator, and a second optical waveguide forming a second arm thereof. The first or second optical waveguide includes capacitive segments that are spaced apart from one another, each forming an electrical capacitor. A travelling wave electrode arrangement applies a voltage across the first or second optical waveguide. The travelling wave electrode arrangement includes waveguide electrodes arranged on the capacitive segments , an electrical line extending along a part of the first or second optical waveguide, the electrical line being arranged a distance from the waveguide electrodes, and connecting arrangements, each being assigned to one of the waveguide electrodes. Each connecting arrangement includes at least two connecting structures spaced apart from one another wherein the waveguide electrodes each are electrically connected to the electrical line via the assigned two connecting structures. | 07-17-2014 |
20090184262 | DEVICE AND METHOD FOR ALTERING THE CHARACTERISTICS OF THREE-DIMENSIONAL SHAPED PARTS USING ELECTRONS AND USE OF SAID METHOD - The invention relates to a device and a method for altering the characteristics of a three-dimensional molded part by means of electrons, including at least one electron accelerator for generating accelerated electrons and two electron exit windows, wherein the two electron exit windows are arranged opposite one another, wherein the two electron exit windows and at least one reflector delimit a process chamber in which the surface or an edge layer of the molded part are bombarded with electrons, wherein an energy density distribution inside the process chamber can be detected at least over one spatial dimension by means of a sensor system. | 07-23-2009 |