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ESSAI, INC.
| ESSAI, INC. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100277191 | SPRING CONTACT PIN FOR AN IC TEST SOCKET AND THE LIKE - A spring contact pin includes a depressible probe member having a tapered configuration that prevents contact between the projecting end of the probe member and the end of the spring barrel throughout the compression and release cycle of the probe. The tapered configuration of the depressible probe member improves the mechanical performance, reliability, and high-speed signal performance of the contact pin. | 11-04-2010 |